Sample thickness determination by measurement of signal intensity in on-axis transmission Kikuchi diffraction



Greater Copenhagen area

The aim of the project is to establish a method to directly extract the sample thickness from the size of the Kikuchi diffraction pattern direct beam.

The broader perspective is to develop a data analysis code which can automatically extract the diameter of the primary beam in all the Kikuchi patterns of a scanned map, transform it in a relative thickness value and plot a 2D thickness variation map as a result.

The envisioned work includes:
  • Learning the use of focused ion beam (FIB) and ion milling for the fabrication of samples with a well-known thickness profile, to be used as calibration samples for the thickness measurement scheme;
  • Determination of the primary beam profile in TKD patterns collected in vacuum;
  • Calculation of the expected oversaturated area vs. thickness trend, its range of validity, and linearity;
  • Analysis of different materials, in view of compiling a library of the measurable thickness range as a function of atomic number;
  • Comparison of the extracted thickness with measurements obtained independently by Electron Energy Loss Spectroscopy (EELS) and/or Convergent Beam Electron Diffraction (CBED).

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Technical University of Denmark

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